Research Interest




  1. Defects and Materials Properties Relationship: Semiconductors, Oxides  and Metals alloys.

  2. Surface properties of  semiconductors: oxidation, surface segregation of dopants .

  3. Oxidation, carburization and corrosion of metal  alloys.

  4. Applications of Surface Techniques: X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy (AES), Ultra Violet Photoelectron Spectroscopy

  5. Application of Local Injection Techniques for Defects assessment in Semiconductors: Electron Beam Induced Current (EBIC), Cathodoluminescence (CL): Experiment and Monte Carlo  Numerical Simulation


 Beam Injection Assessment of Defects in Semiconductors Techniques