Research
Interest
Defects and Materials Properties Relationship: Semiconductors, Oxides and Metals alloys.
Surface properties of
semiconductors: oxidation, surface segregation of dopants
Applications of Surface Techniques: X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy (AES), Ultra Violet Photoelectron Spectroscopy
Application of Local Injection Techniques for Defects assessment in Semiconductors: Electron Beam Induced Current (EBIC), Cathodoluminescence (CL): Experiment and Monte Carlo Numerical Simulation
Beam
Injection Assessment of Defects in Semiconductors Techniques