Department of Computer Engineering
COE 421: Fault Tolerant Computing (3-0-3)
Introduction to fault tolerant computing (FTC). Goals of fault tolerance
(FT). Design techniques to achieve FT. Evaluation of FT systems.
Reliability modeling and analysis of FT systems. Availability modeling.
Design of FT VLSI?WSI circuits. Introduction to testing.
Prerequisite: COE 308 or equivalent.
D. Siewiorek and R. Swarz, ``Reliable Computer Systems: Design and Evaluation'',
Digital-Press, 3rd Edition, 1998.
- (1) Master the fundamental concepts in
- (2) To Master application of the theory of reliability modeling and
- (3) To Master designing reliable and fault tolerant
- (4) Appreciate the basic issues in yield enhancement
of VLSI/WSI circuits.
- (1) To introduce students to the fundamental concepts in
- (2) To expose students to the theory of reliability modeling and
- (3) To introduce students to the basic principles for designing reliable
- (4) To expose students to some of the commercially available fault tolerant/highly available systems.
- (5) To introduce students to the basic issues in yield enhancement
of VLSI/WSI circuits.
- Module 1: Introduction and Fundamental Concepts
(Chapter2 1 and 2)
Origins of FTC, Goals of FT, Applications of FTC, Faults, Errors,
Failures, Fault characterization, Fault modeling.
- Module 2: Design Techniques to Achieve Fault Tolerance
(Cahpetr3 7 Appendix B)
Design issues, Hardware redundancy, Information redundancy, Time
redunadancy, Software redundancy.
- Module 3: Evaluation Techniques
Quantitative evaluation methods, Reliability modeling, Safety modeling,
Availability modeling, maintainability modeling.
- Module 4: Design of Practical Fault-Tolerant Systems
The design process, Fault avoidance, Lonf-life applications,
Critical-computation applications, High-availability applications.
- Module 5: FT Design of VLSI/WSI Circuits
(Chapter 3 and Appendix A)
Failure modes, Self-checking circuits, Reliability & Yield enhancement
of array processros.
- Module 6: Introduction to Testing
(Chapter 4 and Appendix C)
Test pattern generation methods, Design-for-Testability, Testability
Use of available reliability modeling and evaluation tools.
Grading Policy (Tentative):
30% Assignments & Quizzes
15% Major Exam I (Tentatively during week 5)
20% Major Exam II (Tentatively during week 10)
35% Final Exam (Scheduled by the Registrar)
ABET Category content:
Engineering Science: 50 %
Engineering Design: 50%
Prepared by: Prof. Mostafa Abd-El-Barr.
Date: November 2002.